Transmission Electron Microscopy (TEM) Unit
The Transmission Electron Microscope uses a beam of electrons guided through a vacuum column, thanks to electromagnetic lenses, until it passes through the sample of interest. In this process, the beam will be deflected according to the electrodensity of the different structures of the sample, giving rise to an image that can be viewed on a fluorescent screen and collected either with a digital camera or by photographic plates.
The Service has thermionic gun equipment and one with a field emission electron gun, equipped with a STEM module, microanalysis, HAADF detector and cryotransfer, which allows it to obtain high-resolution images, microanalysis with a very small probe diameter (nm.), X-ray mapping with high spatial resolution, as well as study frozen samples or samples sensitive to the electron beam.
In all cases, the samples must have an extremely thin section (35-70 nm).
Instrumental Facilities
JEOL JEM-1010 High Contrast Transmission Electron Microscope (100 kV)
- TEM resolution (0.4 nm)
- Orius CCD Camera and Digital Montage Plug-in
- Tungsten thermonionic source.
JEOL JEM-2010 FEG Ultra High Resolution Field Emission Transmission Electron Microscope (200 kV)
- Ultra high resolution in TEM (0.19 nm point, 0.10 nm line)
- STEM and STEM with HAADF
- EDS microanalysis with low-background injector
- Electron diffraction, convergent beam
- High-resolution CCD camera
- Software e accesorio holder de tomografíaEspectroscopía por perda de energía dos electróns (EELS).
JEOL JEM-1400 Transmission Electron Microscope (120 kV)
- Thermionic source of lanthanum hexaboride.
- TEM mode resolution: 0.38 nm between points and 0.2 nm between lines.
- Resolution in STEM mode: 2.0 nm. SDD (Silicon Drift Detector) type EDS microanalysis, thermoelectrically cooled.
- Resolution of 127eV measured on the K line of Mn at 20,000 cps with an ultra-thin fiestra.
- CCD of 2048×2048 pixels.
- Image control and processing software.
- Set of three sample holders: for 4 samples, double-tilt and single-sample sample holders.
Applications
- Ultrastructure of cells, bacteria, etc.
- Virus localization and diagnosis
- Study of pathologies
- Location of enzymatic activity
- Controlling the deterioration of materials
- Experimental treatments
- Degree of crystallinity and morphology
- Semiconductor defects, etc.
- Study of composted nanoparticles
- Studies of liquid crystals, inorganic and organic, biomaterials, microemulsions
Sample requirements
Contact Technical Staff
More information
María Inés Pazos Garrido – Beatriz Rivas Murias – Catalina Sueiro López – Daniel Carlos Cernadas Fraga
+34 986 812 125 +34 986 812 110
inespazos@uvigo.gal – brivas@uvigo.gal – catalina.sueiro@uvigo.gal – daniel.carlos.cernadas.fraga@uvigo.gal