Scanning Electron Microscopy (SEM) Unit
The Scanning Electron Microscope uses electromagnetic lenses to direct the electron beam to the sample, scanning its surface and generating different interactions, in order to obtain images with topographic or compositional contrast.
In the Service we have thermionic gun and field emission equipment, the latter allowing us to observe samples under low voltage conditions without losing resolution, even in some cases, without the need for coating.
Accessories such as EDS, STEM and cryotechniques make it possible to perform microanalysis, detect transmitted electrons and visualize frozen or beam-sensitive samples.
Samples must be dehydrated and be good conductors of electricity, with the exception of environmental scanning equipment.
Instrumental Facilities
JEOL JSM-6700 f Ultra High Resolution Field Emission Scanning Electron Microscope
- Ultra-high resolution in SEM: 1.0 nm
- high-resolution YAG-type backscatter detector
- STEM detector transmitted electrons
- Microanálise EDS
- Cryotransfer with cryocort
- Load compensator
FEI Quanta 200 Environmental Scatter Electron Microscope
- Working mode in High Vacuum, Low Vacuum (10 to 130 Pa) and ESEM mode (100 to 2600 Pa)
- Kilovolts up to 30 kV
- SEM resolution: 3 nm (SE) and 4 nm (BSE) @30 kV
- backscattered solid-state detector
- Microanálise EDS
JEOL JSM 6010LA Sweep Electron Microscope
- High Vacuum and Low Vacuum working mode (10 – 100 Pa)
- Kilovolts up to 20 kV
- Resolution in SEM Alto Baleiro: 4.0 nm @20 kV
- Resolution in SEM Baixo Baleiro: 5.0 nm @20 kV (BSE Detector)
- Microanálise EDS
- Large samples: X/Y: 80/40 mm; Z (WD): 5-48 mm
Applications
Species identification
- Quality controls
- Microstructure study
- Determination of material morphology
- Study of defects and states of aggregation
- Forensic techniques
- Determination of strata in restoration
- Analysis of particles, nanoparticles and nanostructured materials
- Food structure
- Presence of contaminants
- Corrosion processes
- Characterization of coatings and metallurgical and ceramic structures
- Pictorial layers
- Microelectronics
- Applications in biomedicine: study of cell cultures, tissues and organs
Sample requirements
Contact Technical Staff
More information
María Inés Pazos Garrido – Beatriz Rivas Murias – Catalina Sueiro López – Daniel Carlos Cernadas Fraga
+34 986 812 125 +34 986 812 110
inespazos@uvigo.gal – brivas@uvigo.gal – catalina.sueiro@uvigo.gal – daniel.carlos.cernadas.fraga@uvigo.gal